Wednesday, April 10, 2002

Statistical Track I    1:00 - 2:45 PM  "Data Mining, Multivariate Analysis and Clustering"

1. Spelunking in the Data Mine: On Data Mining as an Analysis Tool for the Optimization of Microprocessor Speed 

Kevin Anderson kevin.c.anderson@intel.com

2.  Using Clustering to Produce and Intuitive Solution for Multivariate Analysis

Nechama Katan (Intel) Nechama.n.katan@intel.com

3.  Application of Multivariate Reduced-Rank Statistical Methods to the Monitoring of Spatial Uniformity of Wafer Etching 

Michael Nikolaou (University of Houston) nikolaou@uh.edu

4.  Cluster Analysis, What, Why, How   

John Plummer (Consultant)  johplummer@aol.com

Statistical Track II   3:15 - 5:00PM "Manufacturability, Testing and Yield"

1. A modularized yield enhancement system in semiconductor manufacturing  

Fei-Long Chen (National Tsing Hua University)  flchen@ie.nthu.edu.tw

2. Neural Network Models for Error Classification and Manufacturing Yield Forecasting 

Armin Schels  (Infineon) armin.schels@infineon.com

3. Basic Area Dependency Yield Model 

Stephen A. Whitlock (Agere)  swhitlock@agere.com

4. Impact of Process Variation on Circuit Performance 

Steven A. Eastman  (Intel)  steve.eastman@intel.com

Thursday, April 11, 2002

Statistical Track III   11:00 - 12:30 "SPC, SPC and Defect Detection"

1. Harnessing the Fourth Dimension for Semiconductor SPC     

Rob Firmin (Foliage Software Systems, Inc.)  rfirmin@foliage.com

2. Spatial Outlier Methods for Detecting Defects in Semiconductor Devices at Electrical Probe

James Stanley (Motorola),  James.D.Stanley@motorola.com

3. The Global Process Control Methodology        

Francois Lemaire  (Si Automation)  f.lemaire@siautomation.com

Statistical Track IV    1:30 - 3:00 "Using Statistics to Reduce or Eliminate Inspection Costs"

1. Reducing/Eliminating Outgoing Testing   

Ed Russell (Cypress Semiconductor) elr@cypress.com

2. Determining Cost Benefits for Less Than 100% Inspection   

Don McCormack  (International SEMATECH) don.mccormack@sematech.org

3. A Breakthrough Statistical Simulation Methodology: The Business Quality's Solution Enabler for Manufacturing Leadership     (Soon Keong Chew (Intel)  soon.keong.chew@intel.com ) CANCELLED

Statistical Track V     3:30 - 5:00 "Statistical Case Studies"

1. Calibration Procedure for an Optical Thickness Measurement Tool: A Case Study 

Simona Spadoni (STMicroelectronics)  simona.spadoni@st.com

2. Components of Variation: A Case Study Where the Software Failed   

Diana Ballard (Cypress Semiconductor)  dhb@cypress.com

3. Application of Statistical Methods for Analysis of DC- and AC- Voltammetric Data for ECD Copper Metallization Process 

Aleksander Jaworski (Technic, Inc.)  alekjawor@aol.com

Friday, April 12, 2002

Statistical Track VI    9:00 - 10:30 "Using Statistics for Industrial Decision Making"

Sherry Cui (Motorola) Sherry.Cui@motorola.com

2. Statistical Methods Application at Varian Semiconductor Equipment Associated, Inc   

Jane Ferrara (Varian Semiconductor)  jane.ferrara@vsea.com

3.Testing Two Variance Components Models

Diane K. Michelson (International Sematech) di.michelson@sematech.org