People

Faculty
 

Yu (Kevin) Cao

Associate Professor, Electrical Engineering
Affiliated Professor, Computer Science and Engineering

B.S. (1996) Peking University, China
M.A. (1999) University of California, Berkeley
Ph.D. (2002) University of California, Berkeley

Prof. Cao was a recipient of the 2009 Promotion and Tenure Faculty Exemplar, ASU, the 2008 Chunhui Award for Outstanding Oversea Chinense Scholars, the 2007 Best Paper Award at ISLPED, the 2006 NSF CAREER Award, the 2006 and 2007 IBM Faculty Award, the 2004 Best Paper Award at ISQED, and the 2000 Beatrice Winner Award at ISSCC. He currently serves on the technical program committee of many design automation and circuit design conferences.

Homepage: http://www.eas.asu.edu/~ycao/
Email: ycao AT asu DOT edu

Students
 

Varsha Balakrishnan

(Joined NIMO Group in 2007)

Research: Resilient design for circuit aging; system performance prediction under variability and reliability.

Email: varsha DOT balakrishnan AT asu DOT edu

Min Chen

(Joined NIMO Group in 2005)

Research: In-situ test design for process variations and reliability degradation; device modeling and characterization for fast statistical simulation.

Email: min DOT chen AT asu DOT edu

Jia Ni

(Joined NIMO Group in 2008)

Research: Reliability analysis of nano-electronic systems; modeling and simulation solutions for fast circuit performance analysis.

Email: jia DOT ni AT asu DOT edu

Saurabh Sinha

(Joined NIMO Group in 2007)

Research: Modeling of carbon nanotube device; design exploration for carbon nanotube-based circuits, especially analog applications.

Email: spshnha1 AT asu DOT edu

Anu Subramaniam

(Part time, Marvell. Joined NIMO Group in 2006)

Research: Process-design co-optimization for manufacturability; fast library characterization for combinational and sequential units; robust design and optimization under variations.

Email: anupama DOT r DOT subramaniam AT asu DOT edu

Jyothi Bhaskarr Velamala

(Joined NIMO Group in 2009)

Research: Reliability effects in scaled CMOS technology and circuits; design and test solutions for resilience.

Email: jvelamal AT asu DOT edu

Chi-Chao Wang

(Joined NIMO Group in 2007)

Research: Predictive modeling for advanced CMOS and emerging technologies; compact modeling and characterization of strain effect.

Email: cwang73 AT asu DOT edu

Yun Ye

(Joined NIMO Group in 2007)

Research: Modeling and simulation method of transistor mismatch due to systematic and random variations; reliable design of memory cells with scaled CMOS technology.

Email: yun DOT ye AT asu DOT edu

Rui Zheng

(Joined NIMO Group in 2008)

Research: Compact modeling of transistor and circuit reliability mechanisms; device and circuit characterization techniques for reliability.

Email: rui DOT zhen DOT 1 AT asu DOT edu

Alumni
 
  • Wei Zhao (Ph.D., March 2009, Thesis "Predictive technology modeling for scaled CMOS design," now with Qualcomm Inc.)
  • Wenping Wang (Ph.D., June 2008, Thesis "Circuit aging in scaled CMOS design: modeling, simulation, and prediction," now with Vitesse Semiconductor Corp.)
  • Dinesh Ganesan (MS, Dec 2007, Thesis "Finite point gate model," now with Freescale)
  • Asha Balijepalli (Ph.D., Dec 2007, Thesis "Compact modeling and applications of a PD SOI MESFET," now with Advanced Micro Devices, Inc.)
  • Ritu Singhal (MS, Sept 2007, Thesis "Compact modeling of non-rectangular gate effect," now with Microchip)
  • Rakesh Vattikonda (MS, July 2007, Thesis "Predictive modeling of NBTI effect," now with Broadcom)
  • Tarun Sairam (MS, July 2006, Thesis "Low-power digital design with FinFET technology," now with Sun)